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Accueil du site > Divers > Soutien à la recherche > Microscopes électroniques en transmission > Fiche JEOL 2010FEG

Fiche JEOL 2010FEG

30 septembre 2008

 

Resolution (elastic image)
Point image
lattice image

0.23 nm
0.14 nm
Energy resolution
Image
Diffration
Spectrum

20 eV (diameter 80 mm in final image)
10 eV (+/- 2.5°)
2 eV
Accelerating voltage up to 200 kV
Electron gun
Brightness
ZrO2/W (100) Schottkeytype
400000000 A/cm2 ** str (at 200 kV)
Objective lens
Spherical aberration coefficient
Chromatic aberration coefficient

1 mm
1.4 mm
Spot size
TEM mode
EDS mode
NBD mode
CBD mode

2 @ 5 nm dia.
1 @ 2.4 nm
1 @ 2.4 nm
1 @ 2.4 nm
Congent-beam electron diffraction
Onvergent angle

1.5 @ 20 mrad or more
Magnification
MAG
LOW MAG
SA MAG

x 5,000 @ 1,500,000
x 200 @ 5,000
x 5,000 @ 1,500,000
Selected area diffraction 20 @ 200 cm
Loss spectrum 0.1 @ 2 mm/eV
Specimen chamber
Specimen tilt angle
X : +/- 42°
Y : +/- 30°
EDS
Solid angle
TAke-off angle

0.13 str
25°