Partenaires

Logo tutelle CNRS
Logo tutelle Ensicaen
Logo tutelle Unicaen
Logo CNRT
Logo Labex EMC3
Logo Carnot


Rechercher

Sur ce site

Sur le Web du CNRS


Intranet Webmail

Accueil du site > Divers > Equipe 2-HOPE Equipe > Rachid BOUREGBA

Rachid BOUREGBA

8 octobre 2010

Rachid BOUREGBA

contact

Tel. +33.2.31.45.13.76
Fax +33.2.31.95.16.00
e-mailrachid.bouregba@ensicaen.fr

Topics of research

- growth of PZT thin films by RF magnetron sputtering.

- characterization and modeling of the dielectric and ferroelectric properties of PZT thin film capacitors (influence of the interfaces, size effects, polarization fatigue).

- since more recently, investigation of the magneto-electric effect in the PZT/TERFENOL

- D thin film heterostructure grown by sputtering.

ShortCV

- 2004 Habilitation à Diriger des Recherches - Université de Caen Basse Normandie.

- 1993 Assistant Professor in Electrical Engineering - Université de Caen Basse Normandie.

- 1991 PhD in Electronics - Université des Sciences et Technologies de Lille.

Some publications

Interface depolarization field as common denominator of fatigue and size effect in PZT ferroelectric thin film capacitors”
R. BOUREGBA, N. SAMA, C. SOYER, G. POULLAIN, AND D. REMIENS
J. Appl. Phys. 107, p. 104102-1 à 104102-9 (2010).

“Analysis of the influence of stress signal frequency on fatigue of ferroelectric thin films”
G. POULLAIN, C. CIBERT, AND R. BOUREGBA.
J. Appl. Phys. 106, p. 124105-1 à 124105-6 (2009).

“Analysis of size effects in Pb(Zr0.54Ti0.46)O3 thin film capacitors with platinum and LaNiO3 conducting oxide electrodes”
R. BOUREGBA, N. SAMA, C. SOYER AND D. REMIENS.
J. Appl. Phys. 106, p. 044101-1 à 044101-7 (2009).

“Investigation of thickness dependence of the ferroelectric properties of Pb(Zr0.6Ti0.4)O3 thin film capacitors”
R. BOUREGBA, G. LE RHUN, G. POULLAIN AND G. LECLERC.
J. Appl. Phys. 99, p. 034102-1 à 034102-7 (2006).

“Polarization loop deformations of an oxygen deficient Pb(Zr0.25,Ti0.75)O3 ferroelectric thin film”
G. LE RHUN, R. BOUREGBA AND G. POULLAIN.
J. Appl. Phys. 96, p. 5712-5721 (2004).

“A model for fatigue in ferroelectric thin films based on trapping of carriers at interfacial states”
G. LE RHUN, G. POULLAIN AND R. BOUREGBA.
J. Appl. Phys. 96, p. 3876-3882 (2004).

“Sawyer-Tower hysteresis measurements on micron sized Pb(Zr,Ti)O3 capacitors”
R. BOUREGBA, B. VILQUIN, G. LE RHUN, G. POULLAIN AND B. DOMENGES.
Review of Scientific Instruments 74, p. 4429-4435 (2003).

“Asymmetrical leakage currents as a possible origin of the polarization offsets observed in compositionally graded ferroelectric films”
R. BOUREGBA, G. POULLAIN, B. VILQUIN AND G. LE RHUN.
J. Appl. Phys. 93, p. 5583-5591 (2003).

“Computation of the polarization due to the ferroelectric layer in a stacked capacitor from Sawyer-Tower hysteresis measurements”
R. BOUREGBA AND G. POULLAIN.
J. Appl. Phys. 93, p. 522-532 (2003).

“Graded ferroelectric thin films possible origin of the shift along the polarization axis”
G. POULLAIN, R. BOUREGBA, B. VILQUIN, G. LE RHUN AND H. MURRAY.
Appl. Phys. Lett. 81, p. 5015-5017 (2002).

“Numerical extraction of the true ferroelectric polarization due to switching domains from hysteresis loops measured using a Sawyer-Tower circuit”
R. BOUREGBA AND G. POULLAIN.
Ferroelectrics 274, p. 165-181 (2002).

“Epitaxial PZT thin films on TiOx covered Pt/MgO substrate by RF magnetron sputtering”
R. BOUREGBA, G. POULLAIN, B. VILQUIN AND H. MURRAY.
Ferroelectrics 256, p. 47-68 (2001).

“Orientation control of textured PZT thin films sputtered on silicon substrate with TiOx seeding”
R. BOUREGBA, G. POULLAIN, B. VILQUIN AND H. MURRAY.
Mat. Res. Bull. 35, p. 1381-1390 (2000).